Introduction to Nanotechnology and Nanoscience. Optical, electronic and scanning probe-based microscopies. Introduction to vacuum and nanomaterial preparation technologies. Structural and chemical characterization techniques for nanomaterials. Optical, electronic and magnetic properties of nanomaterials. Introduction to local functional properties detection methods of nanomaterials.
Lecture notes (written in Italian) will be provided.
Suggestion:
Yang Leng "Materials Characterization: Introduction to Microscopic and pectroscopic Methods" 2nd Edition Ed. J.Wiley VCH 2013
or
R. Kelsall, I. Hamley, M. Geoghegan, Nanoscale Science and Technology,
Ed. J.Wiley & Sons 2005
Learning Objectives
Provide an appropriate methodology for the investigation of materials at the nanoscale. Acquire the concept of measurements based on multiple probes and answers.
Understand the capabilities and the limits of the different chemical, structural and functional characterization techniques for nanomaterials
Prerequisites
Courses to be used as requirements (required and/or recommended)
Courses required: General and Inorganic Chemistry
Courses recommended: Physical Chemistry I, Experimental Physics
Teaching Methods
Total number of hours for Lectures: 24 h
Exercises: 12 h
laboratory: 24 h
Type of Assessment
Oral exam and (optionally) the presentation of a scientific paper describing results on the main topics discussed during the lectures.
Course program
Concepts of Nanoscience and Nanotechnology. Origins and goals of Nanotech. Classification of nanomaterials. Differences between bulk and nanostructured materials. Classification of nanomaterials and of interesting parameters at the nanoscale. Overview of the different characterization tools in terms of used primary and secondary probes (electrons, photons, neutrons, ions...). Instrumental limits and sensibility. Protocols for the analysis of nanomaterials. Morphological characterization tools for nanomaterials; classification of microscopies. Optical microscopy, Confocal Microscopy, Electron microscopies (TEM, SEM). Scanning probe microscopies (STM, AFM, SNOM). Nanomaterial structural analysis: x-ray and electron diffraction techniques. Chemical characterization of nanomaterials. XPS, UPS and AES spectroscopies. EMPA, Ion spectroscopies and X-ray, visible and IR absorption spectroscopies applied to nanomaterials. Analysis of functional properties of nanomaterials; local detection of functional properties and their application in advanced nanomaterial based devices.